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US Patent Issued to Applied Materials on Aug. 25 for "Ion source containing a sputter target" (Massachusetts Inventor)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,007, issued on Aug. 25, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Ion source containing a sputter target" was invented... और पढ़ें


US Patent Issued to HITACHI HIGH-TECH on Aug. 25 for "Electron beam application apparatus and inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,008, issued on Aug. 25, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Electron beam application apparatus and inspection method" was in... और पढ़ें


US Patent Issued to HITACHI HIGH-TECH on Aug. 25 for "Charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,010, issued on Aug. 25, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Charged particle beam device" was invented by Yuta Imai (Tokyo), ... और पढ़ें


US Patent Issued to Hitachi High-Tech on Aug. 25 for "Transmission electron microscope" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,011, issued on Aug. 25, was assigned to Hitachi High-Tech Corp. (Tokyo). "Transmission electron microscope" was invented by Akinari Hanawa ... और पढ़ें


US Patent Issued to FEI on Aug. 25 for "Method of sample preparation and analysis" (Czech Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,012, issued on Aug. 25, was assigned to FEI COMPANY (Hillsboro, Ore.). "Method of sample preparation and analysis" was invented by Michal V... और पढ़ें


US Patent Issued to Hitachi High-Tech on Aug. 25 for "Charged particle beam apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,013, issued on Aug. 25, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam apparatus" was invented by Tetsuro Kadowaki... और पढ़ें


US Patent Issued to Hitachi High-Tech on Aug. 25 for "Processor system capable of communicating with multicharged particle beam device and method thereof" (Japanese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,014, issued on Aug. 25, was assigned to Hitachi High-Tech Corp. (Tokyo). "Processor system capable of communicating with multicharged parti... और पढ़ें


US Patent Issued to Carl Zeiss MultiSEM on Aug. 25 for "Method for operating a multi-beam particle microscope with fast closed-loop beam current control, computer program product and multi-beam particle microscope" (German, Swiss Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,015, issued on Aug. 25, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany). "Method for operating a multi-beam particle microsc... और पढ़ें


US Patent Issued to Energy Sciences on Aug. 25 for "Electron beam curing of clear and pigmented coatings for the coil industry and method thereof" (Massachusetts, New Hampshire Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,016, issued on Aug. 25, was assigned to Energy Sciences Inc. (Wilmington, Mass.). "Electron beam curing of clear and pigmented coatings for... और पढ़ें


US Patent Issued to Jiangsu Jichuang Atomic Cluster Technology Research Institute, Nanjing University on Aug. 25 for "Method for doping two-dimensional material based on cluster ion implantation" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 25 -- United States Patent no. 12,719,017, issued on Aug. 25, was assigned to Jiangsu Jichuang Atomic Cluster Technology Research Institute Co. Ltd. (Nanjing City, China) and Nan... और पढ़ें