ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,985, issued on Sept. 1, was assigned to THE CURATORS OF THE UNIVERSITY OF MISSOURI (Columbia, Mo.). "Multiplex plasmonic sensors on the lon... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,986, issued on Sept. 1, was assigned to Nanyang Technological University (Singapore). "Surface-enhanced Raman scattering (SERS) platform fo... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,987, issued on Sept. 1, was assigned to Matinspired B.V. (Rijen, Netherlands). "Chromium VI test" was invented by Niels Kuijpers (Rijen, Ne... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,988, issued on Sept. 1, was assigned to Gudeng Equipment Co. LTD. (New Taipei City, Taiwan). "Optical inspection system of eliminating imag... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,989, issued on Sept. 1, was assigned to OPXION TECHNOLOGY INC. (New Taipei City, Taiwan). "Optical scanning system for non-destructively ac... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,990, issued on Sept. 1, was assigned to HEUFT SYSTEMTECHNIK GMBH (Burgbrohl, Germany). "Method and apparatus for inspecting full containers... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,991, issued on Sept. 1, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Optical foreign matter inspection device" was invented by Hisaaki... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,992, issued on Sept. 1, was assigned to UTPVISION S.R.L. (Albano Sant' Alessandro, Italy). "Apparatus for detecting surface defects in obje... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,993, issued on Sept. 1, was assigned to Florida Power & Light Co. (Juno Beach, Fla.). "Assessment of utility components using airborne remo... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,994, issued on Sept. 1, was assigned to Viken Detection Corp. (Burlington, Mass.). "Target X-ray inspection system and method" was invented... Read More