ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,994, issued on Sept. 1, was assigned to Viken Detection Corp. (Burlington, Mass.).
"Target X-ray inspection system and method" was invented by Peter J. Rothschild (Newton, Mass.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A target inspection system includes a portable x-ray scanner configured to output a scanning beam of x-rays, a transmission detector module to detect x-rays of the scanning beam of x-rays that are transmitted through a target when the target is interposed between the portable x-ray scanner and the transmission detector module, and a coupling arm configured to couple the portable x-ray scanner to the transmission detector module ...