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US Patent Issued to HAMAMATSU PHOTONICS on Sept. 1 for "Optical measurement device and optical measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,975, issued on Sept. 1, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Optical measurement device and optical measurement me... Read More


US Patent Issued to Zhejiang University on Sept. 1 for "Absorption spectrum-based chemical vapor deposition online in-situ characterization system and method" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,976, issued on Sept. 1, was assigned to Zhejiang University (Hangzhou, China). "Absorption spectrum-based chemical vapor deposition online ... Read More


US Patent Issued to Teledyne FLIR Defense on Sept. 1 for "Modular sensor core visualization systems and methods" (Oklahoma, Indiana, California, Pennsylvania Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,977, issued on Sept. 1, was assigned to Teledyne FLIR Defense Inc. (Stillwater, Okla.). "Modular sensor core visualization systems and meth... Read More


US Patent Issued to HORIBA ADVANCED TECHNO on Sept. 1 for "Optical analysis device and combined analysis device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,978, issued on Sept. 1, was assigned to HORIBA ADVANCED TECHNO Co. LTD. (Kyoto, Japan). "Optical analysis device and combined analysis devi... Read More


US Patent Issued to TRINAMIX on Sept. 1 for "System and a method for classifying a sample into one of at least two types of polyamide" (German Inventor)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,979, issued on Sept. 1, was assigned to TRINAMIX GMBH (Ludwigshafen am Rhein, Germany). "System and a method for classifying a sample into ... Read More


US Patent Issued to THE BOEING on Sept. 1 for "Microspot reflectometer" (Missouri Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,980, issued on Sept. 1, was assigned to THE BOEING COMPANY (Arlington, Va.). "Microspot reflectometer" was invented by Brian Gunther (St. L... Read More


US Patent Issued to FLASH PATHOLOGY on Sept. 1 for "Femtosecond pulsed microscopy" (Dutch Inventor)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,981, issued on Sept. 1, was assigned to FLASH PATHOLOGY B.V. (Amsterdam). "Femtosecond pulsed microscopy" was invented by Frank Van Mourik ... Read More


US Patent Issued to Canon on Sept. 1 for "Cell analysis method and cell analysis system" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,982, issued on Sept. 1, was assigned to Canon K.K. (Tokyo). "Cell analysis method and cell analysis system" was invented by Yuichiro Iwamot... Read More


US Patent Issued on Sept. 1 for "Apparatus and method for non-contact detection of hydrocarbon and other fluorescence materials on a surface" (Indiana, Texas Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,983, issued on Sept. 1. "Apparatus and method for non-contact detection of hydrocarbon and other fluorescence materials on a surface" was i... Read More


US Patent Issued to Institute of Biophysics, Chinese Academy of Sciences on Sept. 1 for "Real-time fluorescence monitoring system for cryo-focused ion beam milling device and method" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,984, issued on Sept. 1, was assigned to Institute of Biophysics, Chinese Academy of Sciences (Beijing). "Real-time fluorescence monitoring ... Read More