US Patent Issued to HORIBA ADVANCED TECHNO on Sept. 1 for "Optical analysis device and combined analysis device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,723,978, issued on Sept. 1, was assigned to HORIBA ADVANCED TECHNO Co. LTD. (Kyoto, Japan).

"Optical analysis device and combined analysis device" was invented by Hiroshi Saito (Kyoto, Japan) and Tatsuya Nakahara (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical analysis device that analyzes a sample by irradiating an optical cell containing the sample with light, and detecting light transmitted through the optical cell, the optical analysis device including: a first light source and a second light source each emitting light in a spectrum different from a spectrum of another; an optical element that reflects a part and transmits an...