US Patent Issued to THRUWAVE on June 16 for "Systems and methods for high throughput anomaly detection with 3-d millimeter wave imaging" (Washington Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,683, issued on June 16, was assigned to THRUWAVE INC. (Seattle). "Systems and methods for high throughput anomaly detection with 3-d millim... Read More

US Patent Issued to JFE Steel on June 16 for "Apparatus and method for measuring granular objects, abnormality detection method, and method for producing granular iron" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,684, issued on June 16, was assigned to JFE Steel Corp. (Tokyo). "Apparatus and method for measuring granular objects, abnormality detectio... Read More

US Patent Issued to Powerchip Semiconductor Manufacturing on June 16 for "Wafer optical inspection system and inspection method" (Taiwanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,685, issued on June 16, was assigned to Powerchip Semiconductor Manufacturing Corp. (Hsinchu, Taiwan). "Wafer optical inspection system and... Read More

US Patent Issued to Nanotronics Imaging on June 16 for "Line defect detection" (New York Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,686, issued on June 16, was assigned to Nanotronics Imaging Inc. (Cuyahoga Falls, Ohio). "Line defect detection" was invented by Joanna Lee... Read More

US Patent Issued to Logistics and Supply Chain MultiTech R&D Centre on June 16 for "Apparatus and method for generating random images of a herbal formulation" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,687, issued on June 16, was assigned to Logistics and Supply Chain MultiTech R&D Centre Ltd. (Pok Fu Lam, Hong Kong). "Apparatus and method... Read More

US Patent Issued to Yangtze Memory Technologies on June 16 for "Method and device for detecting word line shorts in memory device" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,688, issued on June 16, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China). "Method and device for detecting word line sho... Read More

US Patent Issued to Onto Innovation on June 16 for "Substrate defect-detection and comparison" (Massachusetts Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,689, issued on June 16, was assigned to Onto Innovation Inc. (Wilmington, Mass.). "Substrate defect-detection and comparison" was invented ... Read More

US Patent Issued to OMRON on June 16 for "Component inspection device" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,690, issued on June 16, was assigned to OMRON Corp. (Kyoto, Japan). "Component inspection device" was invented by Aoi Mochizuki (Kyoto, Jap... Read More

US Patent Issued to Deere & Co. on June 16 for "Plant treatment model training based on agricultural image interaction" (California, Iowa Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,691, issued on June 16, was assigned to Deere & Co. (Moline, Ill.). "Plant treatment model training based on agricultural image interaction... Read More

US Patent Issued to HITACHI ASTEMO on June 16 for "Visual inspection device, visual inspection method, image generation device, and image generation method" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,692, issued on June 16, was assigned to HITACHI ASTEMO LTD. (Hitachinaka, Japan). "Visual inspection device, visual inspection method, imag... Read More

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