US Patent Issued to Onto Innovation on June 16 for "Substrate defect-detection and comparison" (Massachusetts Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,657,689, issued on June 16, was assigned to Onto Innovation Inc. (Wilmington, Mass.).

"Substrate defect-detection and comparison" was invented by Jason Paul Remillard (Groton, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Various examples described herein include image-processing tasks of image data used for defect detection and comparison of features on substrates. At least one of a deep-convnet-based and a transformer-based backbone network (a common backbone) that is arranged to convert various types of raw-image data into features that can, in turn, be used by smaller neural networks to perform final calculations of specific tasks. The smalle...