US Patent Issued to SEIKO EPSON on April 14 for "MEMS device and inertial measurement unit" (Japanese Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,754, issued on April 14, was assigned to SEIKO EPSON Corp. (Japan). "MEMS device and inertial measurement unit" was invented by Satoru Tan... Read More

US Patent Issued to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT on April 14 for "Characteristic calculation device, characteristic calculation method, and non-transitory computer-readable recording medium" (Japanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,755, issued on April 14, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan). "Characteristic calculation d... Read More

US Patent Issued to UNITED MICROELECTRONICS on April 14 for "Matching method for semiconductor topography measurement and processing device using the same" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,756, issued on April 14, was assigned to UNITED MICROELECTRONICS CORP. (Hsinchu, Taiwan). "Matching method for semiconductor topography me... Read More

US Patent Issued to DONG-A UNIVERSITY RESEARCH FOUNDATION FOR INDUSTRY-ACADEMY COOPERATION on April 14 for "Ultra-micro electrode for electrochemical analysis and method of manufacturing the same" (South Korean Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,757, issued on April 14, was assigned to DONG-A UNIVERSITY RESEARCH FOUNDATION FOR INDUSTRY-ACADEMY COOPERATION (Busan, South Korea). "Ult... Read More

US Patent Issued on April 14 for "Socketed probes" (Texas Inventor)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,758, issued on April 14. "Socketed probes" was invented by Raul Molina (Austin, Texas). According to the abstract* released by the U.S. P... Read More

US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Cantilever probe card device and light scattering probe" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,759, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Cantilever probe card device and ... Read More

US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Probe card device and tunnel-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,760, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Probe card device and tunnel-type... Read More

US Patent Issued to CHUNGHWA PRECISION TEST TECH. on April 14 for "Vertical probe card and open-type probe thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,761, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan). "Vertical probe card and open-type... Read More

US Patent Issued to F Time Technology Industrial on April 14 for "Test terminal" (Taiwanese Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,762, issued on April 14, was assigned to F Time Technology Industrial Co. Ltd. (New Taipei City, Taiwan). "Test terminal" was invented by ... Read More

US Patent Issued to Schweitzer Engineering Laboratories on April 14 for "Current sensor with adjacent conductor rejection" (Idaho, Washington Inventors)

ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,763, issued on April 14, was assigned to Schweitzer Engineering Laboratories Inc. (Pullman, Wash.). "Current sensor with adjacent conducto... Read More

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