ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,761, issued on April 14, was assigned to CHUNGHWA PRECISION TEST TECH. Co. LTD. (Taoyuan City, Taiwan).
"Vertical probe card and open-type probe thereof" was invented by Yu-Ju Lu (Taoyuan City, Taiwan), Yi-Hsien Chen (Taoyuan City, Taiwan), Meng-Chieh Cheng (Taipei City, Taiwan) and Wei-Jhih Su (Taichung City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An open-type probe of a vertical probe card includes a frame, an elastic member, and a pin. The frame has an operation slot and two lateral openings being in spatial communication with the operation slot. The elastic member is assembled to the frame and is located in the operation slot. Th...