ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,960, issued on July 14, was assigned to Molecular Devices (Austria) GmbH (Puch, Austria). "System and method for measuring optical detector... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,961, issued on July 14, was assigned to Julius-Maximilians-Universitat Wurzburg (Wurzburg, Germany). "Sub-10 nanometer fluorescence imaging... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,962, issued on July 14, was assigned to RICOH COMPANY LTD. (Tokyo). "Car body inspection device, car body inspection system, and car body i... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,963, issued on July 14, was assigned to Mitutoyo Corp. (Kanagawa-Ken, Japan). "Machine vision system utilizing autofocus and inspection pro... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,964, issued on July 14, was assigned to NOVA LTD. (Rehovot, Israel). "Time-domain optical metrology and inspection of semiconductor devices... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,965, issued on July 14, was assigned to CKD Corp. (Aichi, Japan). "Attenuating an inspection device that inspects transparent or translucen... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,966, issued on July 14, was assigned to Deere & Co. (Moline, Ill.). "Method for non-contact ground moisture level estimation at various dep... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,967, issued on July 14, was assigned to Tohoku University (Sendai, Japan). "Method for calculating elastic modulus and device for calculati... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,968, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Soft x-ray optics with improved filtering" was invented by Alexander... और पढ़ें
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,969, issued on July 14, was assigned to The Regents of the University of California (Oakland, Calif.). "Methods for collecting electron dif... और पढ़ें