ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,290, issued on Nov. 3, was assigned to KOENIG & BAUER AG (Wurzburg, Germany). "Machine for handling sheets, comprising an inspection device ... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,291, issued on Nov. 3. "Defect inspection system using 3D measuring machine" was invented by Young Han Lim (Seoul, South Korea). According ... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,292, issued on Nov. 3, was assigned to MITSUBISHI HEAVY INDUSTRIES LTD. (Tokyo). "Diagnosis method, diagnosis device, and program" was inven... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,293, issued on Nov. 3, was assigned to LG Energy Solution Ltd. (Seoul, South Korea). "Electrode sheet defect inspection device" was invented... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,294, issued on Nov. 3, was assigned to KNOW LABS INC. (Seattle). "Method to enhance a non-invasive RF analyte detection device" was invented... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,295, issued on Nov. 3, was assigned to RTX Corp. (Farmington, Conn.). "Method and apparatus for using radiation imaging data to analyze comp... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,296, issued on Nov. 3, was assigned to Saudi Arabian Oil Co. (Dhahran, Saudi Arabia). "In-situ imaging and characterization of hydraulic fra... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,297, issued on Nov. 3, was assigned to FUJIFILM Corp. (Tokyo). "Radiography apparatus" was invented by Tatsuhiko Hayashi (Tokyo), Takafumi I... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,298, issued on Nov. 3, was assigned to RIKEN (Japan). "Observation device, and cross-sectional image acquisition method" was invented by Kun... और पढ़ें
ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,300, issued on Nov. 3, was assigned to RTX Corp. (Farmington, Conn.). "Method and apparatus for using radiation imaging data to analyze comp... और पढ़ें