ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,300, issued on Nov. 3, was assigned to RTX Corp. (Farmington, Conn.).

"Method and apparatus for using radiation imaging data to analyze components" was invented by Christopher Pelliccione (Tolland, Conn.), Iuliana Cernatescu (Glastonbury, Conn.), Robert Koch (Hartford, Conn.), David Furrer (Marlborough, Conn.) and Ryan Breneman (Newington, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detecto...