US Patent Issued to RIKEN on Nov. 3 for "Observation device, and cross-sectional image acquisition method" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,298, issued on Nov. 3, was assigned to RIKEN (Japan).

"Observation device, and cross-sectional image acquisition method" was invented by Kunihiro Fujita (Wako, Japan), Takaoki Takanashi (Wako, Japan), Chihiro Iwamoto (Wako, Japan) and Yoshie Otake (Wako, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An observation device includes a neutron emission device, a detection device, and a data processing device. The neutron emission device emits neutrons to an inspection object. The detection device detects exit neutrons from the inspection object at one set of detection positions in a peripheral direction around the inspection object, outside the in...