ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,155, issued on June 23, was assigned to Bourns Inc. (Riverside, Calif.). "Surface mount electrical devices and methods" was invented by Kel... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,156, issued on June 23, was assigned to L3HARRIS TECHNOLOGIES INC. (Melbourne, Fla.). "Nightvision tube module simplification" was invented... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,157, issued on June 23, was assigned to FEI COMPANY. "Techniques for narrowing zero loss peaks in monochromated charged particles sources" ... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,158, issued on June 23, was assigned to JEOL Ltd. (Tokyo). "Charged particle beam source and charged particle beam system" was invented by ... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,159, issued on June 23, was assigned to Carl Zeiss MultiSEM GmbH (Oberkochen, Germany). "Multi-beam particle beam system" was invented by D... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,160, issued on June 23, was assigned to Fractilia LLC (Austin, Texas). "System and method for generating and analyzing roughness measuremen... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,161, issued on June 23, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam system" was invented by Heita Kimizuka (Tok... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,162, issued on June 23, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Dual-use read-out circuitry in charged particle de... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,163, issued on June 23, was assigned to Northwestern University (Evanston, Ill.). "Microchips for use in electron microscopes and related m... Read More
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,665,164, issued on June 23, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Alignment determination method and computer progra... Read More