ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,774, issued on April 14, was assigned to INVENSENSE INC. (San Jose, Calif.). "Low noise readout interface for capacitive sensors with nega... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,775, issued on April 14, was assigned to CEYEAR TECHNOLOGIES Co. LTD. (Qingdao, China). "Method and system for testing conversion losses o... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,776, issued on April 14, was assigned to Qualtec Co. Ltd. (Osaka-fu, Japan). "Power-semiconductor-device test apparatus facilitating test-... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,777, issued on April 14, was assigned to Industrial Technology Research Institute (Hsinchu, Taiwan). "Inspection system and method for ins... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,778, issued on April 14, was assigned to SK HYNIX INC. (Icheon-si, South Korea) and FEMTOMETRIX INC. (Los Angeles). "Field-biased nonlinea... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,779, issued on April 14, was assigned to Sandisk Technologies Inc. (Milpitas, Calif.). "Determining a back drilling depth for a printed ci... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,780, issued on April 14, was assigned to THE TEXAS A&M UNIVERSITY SYSTEM (Bryan, Texas). "Methods and systems for detecting compromised se... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,781, issued on April 14, was assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES LLC (Scottsdale, Ariz.). "Built-in self-test circuit and meth... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,782, issued on April 14, was assigned to UNITEST INC (Yongin-si, South Korea). "Probe card holder for wafer testing" was invented by Dae K... Read More
ALEXANDRIA, Va., April 15 -- United States Patent no. 12,601,783, issued on April 14, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Measurement system" was invented by Matthias Ruengeler (... Read More