ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,964, issued on July 14, was assigned to NOVA LTD. (Rehovot, Israel). "Time-domain optical metrology and inspection of semiconductor devices... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,965, issued on July 14, was assigned to CKD Corp. (Aichi, Japan). "Attenuating an inspection device that inspects transparent or translucen... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,966, issued on July 14, was assigned to Deere & Co. (Moline, Ill.). "Method for non-contact ground moisture level estimation at various dep... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,967, issued on July 14, was assigned to Tohoku University (Sendai, Japan). "Method for calculating elastic modulus and device for calculati... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,968, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Soft x-ray optics with improved filtering" was invented by Alexander... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,969, issued on July 14, was assigned to The Regents of the University of California (Oakland, Calif.). "Methods for collecting electron dif... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,970, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Methods and systems for x-ray scatterometry measurements employing a... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,971, issued on July 14, was assigned to SHIMADZU Corp. (Kyoto, Japan). "Analysis system, analysis device, and control method" was invented ... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,972, issued on July 14, was assigned to SHIMADZU Corp. (Kyoto, Japan). "X-ray fluorescence spectrometer and power supply apparatus" was inv... Read More
ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,974, issued on July 14, was assigned to ABB Schweiz AG (Baden, Switzerland). "Computer implemented method for providing temperature data, a... Read More