ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,232, issued on Sept. 1, was assigned to Novocure GmbH (Baar, Switzerland). "Removal of background noise from image" was invented by Yana Gl... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,233, issued on Sept. 1, was assigned to BAE Systems Information and Electronic Systems Integration Inc. (Nashua, N.H.). "Automatic determin... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,234, issued on Sept. 1, was assigned to CANON K.K. (Tokyo). "Image processing apparatus, image capturing apparatus, image processing method... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,235, issued on Sept. 1, was assigned to Ricoh Co. Ltd. (Tokyo). "Image processing apparatus, information processing system, image processin... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,236, issued on Sept. 1. "Low-light image enhancement method and device based on wavelet transform and Retinex-Net" was invented by Dengyin ... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,237, issued on Sept. 1, was assigned to CANON K.K. (Tokyo). "Image processing apparatus, image pickup apparatus, and image processing metho... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,238, issued on Sept. 1, was assigned to Intelligrated Headquarters LLC (Mason, Ohio). "Methods, apparatuses and computer program products f... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,239, issued on Sept. 1, was assigned to International Business Machines Corp. (Armonk, N.Y.). "Underwater machinery performance analysis us... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,240, issued on Sept. 1, was assigned to KWANSEI GAKUIN EDUCATIONAL FOUNDATION (Hyogo, Japan) and TOYOTA TSUSHO Corp. (Nagoya, Japan). "Heat... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,241, issued on Sept. 1, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Optical inspection-based automatic defect classifica... Read More