ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,725,240, issued on Sept. 1, was assigned to KWANSEI GAKUIN EDUCATIONAL FOUNDATION (Hyogo, Japan) and TOYOTA TSUSHO Corp. (Nagoya, Japan).
"Heat treatment environment evaluation method and silicon carbide substrate" was invented by Tadaaki Kaneko (Sanda, Japan) and Daichi Dojima (Sanda, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present invention is to provide a novel technique for evaluating a heat treatment environment. The present invention is a method for evaluating a heat treatment environment, the method comprising an image acquisition step of acquiring an image by making an electron beam incident at an incident angle inc...