ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,171, issued on Sept. 8, was assigned to University of Virginia Patent Foundation (Charlottesville, Va.). "System and method for distortion ... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,172, issued on Sept. 8, was assigned to Children's Medical Center Corp. (Boston). "Estimating motion of a subject from slices acquired duri... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,378, issued on Sept. 8, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "Photoresist underlayer and meth... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,379, issued on Sept. 8, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Container stopper, substrate processing syst... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,380, issued on Sept. 8, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Method of controlling semiconductor process ... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,381, issued on Sept. 8, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "Inspection tool for a semiconductor... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,382, issued on Sept. 8, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Method of configuring extreme ultra-violet (... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,383, issued on Sept. 8, was assigned to HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hubei, China). "Quasi-dynamic in situ ellipsometry m... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,384, issued on Sept. 8, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Light sources and methods of controlling devices a... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,385, issued on Sept. 8, was assigned to Gigaphoton Inc. (Tochigi, Japan). "Electronic device manufacturing method and lithography control p... और पढ़ें