Exclusive

Publication

Byline

Location

US Patent Issued to Saudi Arabian Oil on July 14 for "Siderophore-based biosensors for iron detection" (Saudi Arabia Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,959, issued on July 14, was assigned to Saudi Arabian Oil Co. (Dhahran, Saudi Arabia). "Siderophore-based biosensors for iron detection" wa... Read More


US Patent Issued to Molecular Devices (Austria) on July 14 for "System and method for measuring optical detector signals having extended dynamic range" (Austrian Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,960, issued on July 14, was assigned to Molecular Devices (Austria) GmbH (Puch, Austria). "System and method for measuring optical detector... Read More


US Patent Issued to Julius-Maximilians-Universitat Wurzburg on July 14 for "Sub-10 nanometer fluorescence imaging" (German Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,961, issued on July 14, was assigned to Julius-Maximilians-Universitat Wurzburg (Wurzburg, Germany). "Sub-10 nanometer fluorescence imaging... Read More


US Patent Issued to RICOH on July 14 for "Car body inspection device, car body inspection system, and car body inspection method" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,962, issued on July 14, was assigned to RICOH COMPANY LTD. (Tokyo). "Car body inspection device, car body inspection system, and car body i... Read More


US Patent Issued to Mitutoyo on July 14 for "Machine vision system utilizing autofocus and inspection processes" (Washington, Oregon Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,963, issued on July 14, was assigned to Mitutoyo Corp. (Kanagawa-Ken, Japan). "Machine vision system utilizing autofocus and inspection pro... Read More


US Patent Issued to NOVA on July 14 for "Time-domain optical metrology and inspection of semiconductor devices" (Israeli Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,964, issued on July 14, was assigned to NOVA LTD. (Rehovot, Israel). "Time-domain optical metrology and inspection of semiconductor devices... Read More


US Patent Issued to CKD on July 14 for "Attenuating an inspection device that inspects transparent or translucent cylindrical body" (Japanese Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,965, issued on July 14, was assigned to CKD Corp. (Aichi, Japan). "Attenuating an inspection device that inspects transparent or translucen... Read More


US Patent Issued to Deere & Co. on July 14 for "Method for non-contact ground moisture level estimation at various depths using reflected energy at a work machine" (Illinois Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,966, issued on July 14, was assigned to Deere & Co. (Moline, Ill.). "Method for non-contact ground moisture level estimation at various dep... Read More


US Patent Issued to Tohoku University on July 14 for "Method for calculating elastic modulus and device for calculating elastic modulus" (Japanese Inventor)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,967, issued on July 14, was assigned to Tohoku University (Sendai, Japan). "Method for calculating elastic modulus and device for calculati... Read More


US Patent Issued to KLA on July 14 for "Soft x-ray optics with improved filtering" (Texas, California Inventors)

ALEXANDRIA, Va., July 14 -- United States Patent no. 12,680,968, issued on July 14, was assigned to KLA Corp. (Milpitas, Calif.). "Soft x-ray optics with improved filtering" was invented by Alexander... Read More