ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,552, issued on Sept. 15, was assigned to GEN-PROBE Inc. (San Diego) and GRIFOLS, S.A (Barcelona, Spain). "Gripper apparatus with reduced c... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,553, issued on Sept. 15, was assigned to SYSMEX Corp. (Hyogo, Japan). "Testing system, storage device, and rack storage method" was invent... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,554, issued on Sept. 15, was assigned to Mettler-Toledo GmbH (Greifensee, Switzerland). "Sample carrier, sample storages, lifting forks an... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,555, issued on Sept. 15, was assigned to HITACHI HIGH-TECH Corp. (Tokyo). "Automatic analyzer" was invented by Chikook Ha (Tokyo) and Youi... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,556, issued on Sept. 15, was assigned to NANCHANG ANGKUN Co. LTD. (Nanchang, China). "Method and apparatus for measuring rotational speed ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,557, issued on Sept. 15, was assigned to STMicroelectronics International N.V. (Geneva). "Self-test architecture for MEMS accelerometer: h... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,558, issued on Sept. 15, was assigned to SEIKO EPSON Corp. (Japan). "Inertia measurement device, vehicle, and electronic device" was inven... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,559, issued on Sept. 15, was assigned to SOLARIS NANOFAB LTD. (Suzhou, China). "Test socket for 224GBPS ultra-high-speed coaxial testing" ... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,560, issued on Sept. 15, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea). "Electrically conductive contact pin... Read More
ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,561, issued on Sept. 15, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Amagasaki, Japan). "Probe pin and probe card" was invented by K... Read More