US Patent Issued to SYSMEX on Sept. 15 for "Testing system, storage device, and rack storage method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,553, issued on Sept. 15, was assigned to SYSMEX Corp. (Hyogo, Japan).

"Testing system, storage device, and rack storage method" was invented by Atsushi Kumagai (Kobe, Japan) and Yuji Wakamiya (Kobe, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention allows a rack storage mode to be set in accordance with the situation in a facility. A testing system 1 includes a storage device 240 for storing a rack R holding containers A in which samples tested by the testing units 13 and 14 are accommodated, and the storage device 240 includes a table 130 capable of accommodating a plurality of racks R, a setting unit 230 for setting a first mode ...