US Patent Issued to JAPAN ELECTRONIC MATERIALS on Sept. 15 for "Probe pin and probe card" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,561, issued on Sept. 15, was assigned to JAPAN ELECTRONIC MATERIALS Corp. (Amagasaki, Japan).

"Probe pin and probe card" was invented by Koki Okuma (Amagasaki, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe pin includes a low resistance member consisting of a first metal with a first conductivity, and a high resistance member consisting of a second metal with a second conductivity, the second metal having a resistivity higher than that of the low resistance member. The probe pin has a multi layered part between a contact part and a terminal part, where the multi layered part is configured in the order of the high resistance member, a ...