ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,016, issued on Oct. 27, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea). "Image correction method and system" was invented by I... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,017, issued on Oct. 27, was assigned to Koninklijke Philips N.V. (Einhoven, Netherlands). "HDR out of gamut adjusted tone mapping" was inve... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,018, issued on Oct. 27, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Parallel tone mapping in high-resolution ima... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,019, issued on Oct. 27, was assigned to Spirit AeroSystems Inc. (Wichita, Kan.). "Feature inspection system" was invented by Mark Davis Hay... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,020, issued on Oct. 27, was assigned to Siemens AG (Munich). "Machine learning model for automatically detecting faults using optical inspe... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,021, issued on Oct. 27, was assigned to Pictometry International Corp. (Rochester, N.Y.). "Roof condition assessment using machine learning... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,022, issued on Oct. 27, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Optimization of a metrology algorithm for examina... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,023, issued on Oct. 27, was assigned to Rolls-Royce Corp. (Indianapolis) and Rolls-Royce North American Technologies Inc. (Indianapolis). "... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,024, issued on Oct. 27, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Image inspection system that identifies defective regi... Read More
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,025, issued on Oct. 27, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method and system for anomaly-based defect inspect... Read More