ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,019, issued on Oct. 27, was assigned to Spirit AeroSystems Inc. (Wichita, Kan.).
"Feature inspection system" was invented by Mark Davis Haynes (Andover, Kan.), Glen Paul Cork (Wichita, Kan.), Bharath Achyutha Rao (Wichita, Kan.), John Thomas Baumfalk-Lee (Wichita, Kan.), Matthew W. McKenna (Wichita, Kan.), Bruce E. Gabel (Wichita, Kan.), Scott Bishop (Wichita, Kan.) and Gregorio Balandran (Wichita, Kan.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a pos...