ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,019, issued on Oct. 27, was assigned to Spirit AeroSystems Inc. (Wichita, Kan.). "Feature inspection system" was invented by Mark Davis Hay... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,020, issued on Oct. 27, was assigned to Siemens AG (Munich). "Machine learning model for automatically detecting faults using optical inspe... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,021, issued on Oct. 27, was assigned to Pictometry International Corp. (Rochester, N.Y.). "Roof condition assessment using machine learning... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,022, issued on Oct. 27, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Optimization of a metrology algorithm for examina... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,023, issued on Oct. 27, was assigned to Rolls-Royce Corp. (Indianapolis) and Rolls-Royce North American Technologies Inc. (Indianapolis). "... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,024, issued on Oct. 27, was assigned to FUJIFILM Business Innovation Corp. (Tokyo). "Image inspection system that identifies defective regi... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,025, issued on Oct. 27, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method and system for anomaly-based defect inspect... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,026, issued on Oct. 27, was assigned to Siemens AG (Munich). "Computer-implemented method and tool for optical quality control of intermedi... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,027, issued on Oct. 27, was assigned to Optum Services (Ireland) Ltd. (Dublin). "Predictive data analysis techniques using a hierarchical r... और पढ़ें
ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,028, issued on Oct. 27, was assigned to SHANGHAI UNITED IMAGING HEALTHCARE Co. LTD. (Shanghai). "Methods and systems for image acquisition,... और पढ़ें