ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,919, issued on Oct. 6, was assigned to Hubbell Inc. (Shelton, Conn.). "Compact recloser" was invented by David A. Rhein (Birmingham, Ala.) a... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,920, issued on Oct. 6, was assigned to Saudi Arabian Oil Co. (Dhahran, Saudi Arabia). "Power line protection coordination schemes using pivo... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,921, issued on Oct. 6, was assigned to EATON INTELLIGENT POWER Ltd. (Dublin). "Fuse element assembly and method of fabricating the same" was... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,922, issued on Oct. 6, was assigned to KLA Corp. (Milpitas, Calif.). "Method of fabricating a high-pressure laser-sustained-plasma lamp" was... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,923, issued on Oct. 6, was assigned to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH (Heimstetten, Germany). "De... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,924, issued on Oct. 6, was assigned to FEI Co. "Aberration correction systems and charged particle microscope systems including the same" wa... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,925, issued on Oct. 6, was assigned to The Regents of the University of California (Oakland, Calif.). "System and method for fully integrate... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,926, issued on Oct. 6, was assigned to Hitachi High-Tech Corp. (Tokyo). "Sample image observation device and method" was invented by Yuta Im... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,927, issued on Oct. 6, was assigned to FEI Co. (Hillsboro, Ore.). "Pixel elements, particle beam microscopes including the same, and associa... Read More
ALEXANDRIA, Va., Oct. 6 -- United States Patent no. 12,755,928, issued on Oct. 6, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Operation methods of 2D pixelated detector for an ap... Read More