US Patent Issued to Applied Materials on June 30 for "Apparatus and method for sensing RF signals from RF plasma processing equipment" (Irish Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,440, issued on June 30, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Apparatus and method for sensing RF signals from RF ... Read More

US Patent Issued to Consolidated Nuclear Security on June 30 for "Methods and kits for rapid, colormetric beryllium detection" (Tennessee Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,441, issued on June 30, was assigned to Consolidated Nuclear Security LLC (Oak Ridge, Tenn.). "Methods and kits for rapid, colormetric bery... Read More

US Patent Issued to Lili Yu on June 30 for "Water test paper and multifunctional detection test kit" (Chinese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,442, issued on June 30, was assigned to Lili Yu (Shenzhen City, China). "Water test paper and multifunctional detection test kit" was inven... Read More

US Patent Issued to TestCard on June 30 for "Bodily fluid testing method" (British Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,443, issued on June 30, was assigned to TestCard Ltd (East Ayton, Great Britain). "Bodily fluid testing method" was invented by Luke Heron ... Read More

US Patent Issued to The Boeing on June 30 for "System and method of inspecting a surface" (Washington, Missouri Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,444, issued on June 30, was assigned to The Boeing Co. (Arlington, Va.). "System and method of inspecting a surface" was invented by Veniam... Read More

US Patent Issued on June 30 for "High-speed automatic film-foreign substance detection apparatus" (South Korean Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,445, issued on June 30. "High-speed automatic film-foreign substance detection apparatus" was invented by Jin Ho Kim (Suwon-si, South Korea... Read More

US Patent Issued to Carl Zeiss SMT on June 30 for "System and method for inspecting a mask for EUV lithography" (German Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,446, issued on June 30, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany). "System and method for inspecting a mask for EUV lithogr... Read More

US Patent Issued to ANRITSU on June 30 for "Article inspection apparatus" (Japanese Inventor)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,447, issued on June 30, was assigned to ANRITSU Corp. (Kanagawa, Japan). "Article inspection apparatus" was invented by Takashi Kanai (Kana... Read More

US Patent Issued to ISHIDA on June 30 for "X-ray inspection apparatus" (Japanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,448, issued on June 30, was assigned to ISHIDA Co. LTD. (Kyoto, Japan). "X-ray inspection apparatus" was invented by Shinya Ikeda (Ritto, J... Read More

US Patent Issued to SAFRAN AIRCRAFT ENGINES on June 30 for "Tomographic analysis method for detecting anomalies" (French Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,449, issued on June 30, was assigned to SAFRAN AIRCRAFT ENGINES (Paris). "Tomographic analysis method for detecting anomalies" was invented... Read More

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