ALEXANDRIA, Va., July 16 -- United States Patent no. 12,669,448, issued on June 30, was assigned to ISHIDA Co. LTD. (Kyoto, Japan).
"X-ray inspection apparatus" was invented by Shinya Ikeda (Ritto, Japan), Kazuyuki Sugimoto (Ritto, Japan) and Shinya Yamamoto (Ritto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray inspection apparatus includes a transport unit that transports an article; an irradiation unit that irradiates the article, which is transported by the transport unit, with X-rays; a sensor unit that detects the X-rays; and a control unit that generates an inspection image including the article from a detection result of the X-rays by the sensor unit, and that inspects whether the arti...