US Patent Issued to SAMSUNG ELECTRONICS on May 12 for "Apparatus for testing image sensor and operating method thereof" (South Korean Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,172, issued on May 12, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Apparatus for testing image sensor and operati... Read More

US Patent Issued to THE BOEING on May 12 for "Methods and apparatus for in-situ measurement of mutual inductance between embedded interconnects" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,173, issued on May 12, was assigned to THE BOEING COMPANY (Arlington, Va.). "Methods and apparatus for in-situ measurement of mutual inducta... Read More

US Patent Issued on May 12 for "Assessment of metallic structures in contact with an electrolyte" (German Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,174, issued on May 12. "Assessment of metallic structures in contact with an electrolyte" was invented by Mark Glinka (Berlin), Albin Hertri... Read More

US Patent Issued to UNIVERSITE DE RENNES, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE RENNES, CENTRALESUPELEC on May 12 for "Device for electromagnetic exposure assessment comprising a field enhancing element" (French Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,175, issued on May 12, was assigned to UNIVERSITE DE RENNES (Rennes, France), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris), INSTITUT ... Read More

US Patent Issued to ADVANTEST on May 12 for "Testing apparatus, testing method, and computer-readable storage medium" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,176, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo). "Testing apparatus, testing method, and computer-readable storage medium" wa... Read More

US Patent Issued to Nvidia on May 12 for "Automatic board probing station" (Oregon Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,177, issued on May 12, was assigned to Nvidia Corp. (Santa Clara, Calif.). "Automatic board probing station" was invented by Akhilesh Sandee... Read More

US Patent Issued to ADVANTEST on May 12 for "Automatic test equipment" (Japanese Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,178, issued on May 12, was assigned to ADVANTEST Corp. (Tokyo). "Automatic test equipment" was invented by Hiroki Ichikawa (Tokyo) and Tasuk... Read More

US Patent Issued to Texas Instruments on May 12 for "Methods and apparatus to identify faults in processors" (Texas Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,179, issued on May 12, was assigned to Texas Instruments Inc. (Dallas). "Methods and apparatus to identify faults in processors" was invente... Read More

US Patent Issued to INTEL NDTM US on May 12 for "Diagnostic ring oscillator circuit for DC and transient characterization" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,180, issued on May 12, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.). "Diagnostic ring oscillator circuit for DC and transient cha... Read More

US Patent Issued to ABB Schweiz on May 12 for "Monitoring system for a mechanically driven circuit breaker" (German, Italian Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,181, issued on May 12, was assigned to ABB Schweiz AG (Baden, Switzerland). "Monitoring system for a mechanically driven circuit breaker" wa... Read More

• ««
• «
• 79564
• 79565
• 79566
• 79567
• 79568
• 79569
• 79570
• 79571
• 79572
• 79573
• »
• »»