US Patent Issued to Texas Instruments on May 12 for "Methods and apparatus to identify faults in processors" (Texas Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,179, issued on May 12, was assigned to Texas Instruments Inc. (Dallas).

"Methods and apparatus to identify faults in processors" was invented by Devanathan Varadarajan (Allen, Texas) and Benjamin Niewenhuis (Richardson, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An example device includes built in test observation controller circuitry configured to: obtain a test; send first instructions to the processor to begin to execute the test by modifying values stored in a plurality of memory circuits; send second instructions to the processor to stop execution of the test at a first simulation time, wherein one or more memory values that are unobse...