US Patent Issued to INTEL NDTM US on May 12 for "Diagnostic ring oscillator circuit for DC and transient characterization" (California Inventors)

ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,180, issued on May 12, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.).

"Diagnostic ring oscillator circuit for DC and transient characterization" was invented by Andreas Kerber (Pleasanton, Calif.) and Phillip Kliza (Folsom, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A ring oscillator (RO) circuit for capturing one or more characteristics relating to aging of CMOS circuitry in a CMOS device has been described. The RO circuit includes a plurality of stages coupled via an RO feedback signal line and forming an inverter chain. The plurality of stages include, for each stage, a respective CMOS inverter comprising a pair of pMOS and nM...