US Patent Issued to VAREX IMAGING, VEC Imaging on May 5 for "Hybrid multi-source x-ray source and imaging system" (American, German Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,544, issued on May 5, was assigned to VAREX IMAGING Corp. (Salt Lake City) and VEC Imaging GmbH & Co. KG (Erlangen, Germany). "Hybrid multi-s... Read More

US Patent Issued to NuFlare Technology on May 5 for "Blanking aperture array system and multi charged particle beam writing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,545, issued on May 5, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Blanking aperture array system and multi charged particle b... Read More

US Patent Issued to APPLIED MATERIALS on May 5 for "Creating ion energy distribution functions (IEDF)" (American, French Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,546, issued on May 5, was assigned to APPLIED MATERIALS Inc. (Santa Clara, Calif.). "Creating ion energy distribution functions (IEDF)" was i... Read More

US Patent Issued to ASML Netherlands on May 5 for "Beam manipulator in charged particle-beam exposure apparatus" (Dutch Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,547, issued on May 5, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Beam manipulator in charged particle-beam exposure app... Read More

US Patent Issued to Mochii on May 5 for "Transmission electron microscopy" (Washington Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,548, issued on May 5, was assigned to Mochii Inc. (Seattle). "Transmission electron microscopy" was invented by Christopher Su-Yan Own (Seatt... Read More

US Patent Issued to ASML Netherlands on May 5 for "Dynamic determination of a sample inspection recipe of charged particle beam inspection" (California Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,549, issued on May 5, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Dynamic determination of a sample inspection recipe of... Read More

US Patent Issued to Imec vzw, Katholieke Universiteit Leuven on May 5 for "Method of performing metrology on a microfabrication pattern" (Belgian Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,550, issued on May 5, was assigned to Imec vzw (Leuven, Belgium) and Katholieke Universiteit Leuven (Leuven, Belgium). "Method of performing ... Read More

US Patent Issued to CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE ROUEN, UNIVERSITE DE ROUEN NORMANDIE on May 5 for "Tomographic atom probe with terahertz pulse generator" (French Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,551, issued on May 5, was assigned to CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (Paris), INSTITUT NATIONAL DES SCIENCES APPLIQUEES DE ROUEN... Read More

US Patent Issued to Applied Materials on May 5 for "Remote surface wave propagation for semiconductor chambers" (California Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,553, issued on May 5, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Remote surface wave propagation for semiconductor chambe... Read More

US Patent Issued to Tokyo Electron on May 5 for "Plasma processing with phase-locked waveforms" (New York Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,620,554, issued on May 5, was assigned to Tokyo Electron Ltd. (Tokyo). "Plasma processing with phase-locked waveforms" was invented by Pingshan L... Read More

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