US Patent Issued to Zscaler on May 5 for "Systems and methods for probability-based inline rule inspection" (California, Texas Inventors)

ALEXANDRIA, Va., May 5 -- United States Patent no. 12,621,266, issued on May 5, was assigned to Zscaler Inc. (San Jose, Calif.).

"Systems and methods for probability-based inline rule inspection" was invented by Juan Gomez (San Jose, Calif.), Anna George (San Jose, Calif.), Jane Joseph (Leander, Texas), Kanti Varanasi (Sunnyvale, Calif.), Nikhil Bhatia (San Jose, Calif.) and Pankaj Kumar (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for probability-based inline rule inspection include performing inline monitoring between one or more endpoints and the internet; receiving a payload based on the inline monitoring; and performing traffic inspection of the payload based on o...