ALEXANDRIA, Va., July 15 -- United States Patent no. 12,661,014, issued on June 23, was assigned to ZHEJIANG PIXFRA TECHNOLOGY Co. LTD. (Hangzhou, China).
"Systems and methods for temperature measurement" was invented by Su Liu (Hangzhou, China), Ziwei Wei (Hangzhou, China), Diquan Xu (Hangzhou, China), Tao Pu (Hangzhou, China), Zhiqiang Yang (Hangzhou, China), Jie Zhan (Hangzhou, China) and Wuping Lu (Hangzhou, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for temperature measurement may be provided. The method may include obtaining an image of an object acquired by an imaging device. The method may also include determining an angle between the object and the imaging device based on the imag...