US Patent Issued to ZF Friedrichshafen on Sept. 15 for "Method and device for determining a semiconductor temperature of a semiconductor element, converter, electric axel drive, and motor vehicle" (German Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,736,416, issued on Sept. 15, was assigned to ZF Friedrichshafen AG (Friedrichshafen, Germany).

"Method and device for determining a semiconductor temperature of a semiconductor element, converter, electric axel drive, and motor vehicle" was invented by Michael Meiler (Bayreuth, Germany) and Johannes Hager (Marktleugast, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining a semiconductor temperature Tj of a semiconductor element of a semiconductor module comprises ascertaining an estimated value of the semiconductor temperature Tj using an optimizable model of a thermal behavior of the semiconductor module, reading a measured...