US Patent Issued to Yokogawa Electric, Yokogawa Test & Measurement on July 7 for "Measurement apparatus and measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 7 -- United States Patent no. 12,674,849, issued on July 7, was assigned to Yokogawa Electric Corp. (Tokyo) and Yokogawa Test & Measurement Corp. (Tokyo).

"Measurement apparatus and measurement method" was invented by Kenji Murakami (Hachioji, Japan) and Naoki Ito (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A phase angle is measured accurately when a resistance component leakage current is measured. A measurement apparatus 10 according to the present disclosure includes a magnetic core 11, first and second coils L1 and L2 wound around the magnetic core 11, a current measurement circuit 12, a voltage measurement circuit 13, a phase angle detection circuit 15, a signal...