ALEXANDRIA, Va., July 16 -- United States Patent no. 12,668,249, issued on June 30, was assigned to YAZAKI Corp. (Tokyo).

"Abnormality detection device, abnormality detection method, and abnormality detection program" was invented by Yuki Takahashi (Susono, Japan), Yoshihiro Takahashi (Susono, Japan) and Jungang Guan (Susono, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality detection device includes a motion detection unit that detects a motion indicating pain associated with a disease of a body of a driver based on motion information of the driver acquired by a camera, a behavior detection unit that detects abnormal behavior of a vehicle based on behavior information acquired by a vehicle...