US Patent Issued to Yangtze Memory Technologies on March 24 for "Method and system of error injection for low-density parity-check" (Chinese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,587,213, issued on March 24, was assigned to Yangtze Memory Technologies Co. Ltd. (Wuhan, China).

"Method and system of error injection for low-density parity-check" was invented by Wen Luo (Wuhan, China) and Yufei Feng (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for verifying a low-density parity-check (LDPC) unit capable of being applied in a memory system can include receiving original data corresponding to a memory device, encoding the original data by the LDPC unit to be verified, injecting errors into the encoded original data by a data pattern for generating verifying data, and verifying a soft decode capability of the ...