US Patent Issued to YANGTZE MEMORY TECHNOLOGIES on April 7 for "Wafer pattern identification system and method" (Chinese Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,768, issued on April 7, was assigned to YANGTZE MEMORY TECHNOLOGIES Co. LTD. (Wuhan, China).

"Wafer pattern identification system and method" was invented by Miaomiao Ma (Wuhan, China), Jin Lyu (Wuhan, China), Zhenghang Wang (Wuhan, China), Peipei Chen (Wuhan, China) and Tao Huang (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A pattern identification system is disclosed. The pattern identification system includes a memory configured to store instructions and a processor coupled to the memory and configured to execute the instructions to perform a process. The process includes receiving measurement data associated with the wafer patter...