ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,768,858, issued on Oct. 20, was assigned to YAMAICHI ELECTRONICS Co. LTD. (Tokyo).

"Contact pin and socket for inspection" was invented by Junichi Miyaaki (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a contact pin and a socket for inspection that can improve electrical performance or thermal performance. An embodiment includes: an electric conductive electrical contact extending from the base end to the tip and having an elastic deformation part elastically expandable and compressible in the extending direction formed between the base end and the tip; an electric conductive thermal contact extending from the base end to the tip and...