US Patent Issued to YAMAHA FINE TECHNOLOGIES on Sept. 8 for "Chamber and leak tester" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,027, issued on Sept. 8, was assigned to YAMAHA FINE TECHNOLOGIES Co. LTD. (Hamamatsu, Japan).

"Chamber and leak tester" was invented by Toru Ishii (Hamamatsu, Japan), Minoru Yamamoto (Fukuroi, Japan), Daisuke Homma (Hamamatsu, Japan) and Kosei Fujita (Hamamatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An object of the present disclosure is to provide a chamber with which inspection conditions of a leak test performed on workpieces of different sizes can easily be managed. The chamber according to an aspect of the present disclosure is a chamber used in a leak tester, and includes: a main chamber for housing a workpiece; a sub-chamber th...