US Patent Issued to XINGR TECHNOLOGIES (ZHEJIANG) on March 24 for "Wafer testing cassette" (Singaporean, Taiwanese Inventors)

ALEXANDRIA, Va., March 24 -- United States Patent no. 12,584,957, issued on March 24, was assigned to XINGR TECHNOLOGIES (ZHEJIANG) Ltd. (Yiwu City, China).

"Wafer testing cassette" was invented by Choon Leong Lou (Singapore) and Ho Yeh Chen (Zhubei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A wafer testing cassette is provided. The wafer testing cassette includes a first housing, a second housing and a magnetic force generating assembly. The first housing include a probe card, the probe card includes at least one probe having a paramagnetic property. The second housing is combined with the first housing and has a magnetic force generating assembly arranged corresponding to the at least one ...