US Patent Issued to X-Scan Imaging on June 2 for "Non-destructive x-ray imaging detector utilizing artificial intelligence to optimize system efficiency" (California Inventors)

ALEXANDRIA, Va., June 2 -- United States Patent no. 12,642,500, issued on June 2, was assigned to X-Scan Imaging Corp. (San Jose, Calif.).

"Non-destructive x-ray imaging detector utilizing artificial intelligence to optimize system efficiency" was invented by Randall Arthur (Campbell, Calif.), Anthony E. Dimalanta (San Jose, Calif.), Nguyen Phuoc Luu (Los Gatos, Calif.), Paul R. Overmyer (Sunnyvale, Calif.) and Chinlee Wang (Saratoga, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A high-energy x-ray camera with radiation-hardened fiber optic faceplate to protect its sensor chip from radiation damage, a field-replaceable scintillator which degrades under radiation. A signal and SNR monitoring system a...