ALEXANDRIA, Va., May 26 -- United States Patent no. 12,639,430, issued on May 26, was assigned to Wiz Inc. (New York).
"Techniques for differential inspection of container layers" was invented by Yaniv Joseph Oliver (Tel Aviv, Israel), Ami Luttwak (Binyamina, Israel), Yinon Costica (Tel Aviv, Israel), Roy Reznik (Tel Aviv, Israel), Yaniv Shaked (Tel Aviv, Israel) and Amir Lande Blau (Tel Aviv, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for reducing redundancy in inspecting container layers for cybersecurity objects includes: a processing circuitry; and a memory, the memory containing instructions that, when executed by the processing circuitry, configure the system to: generate...