US Patent Issued to WISTRON on Nov. 3 for "Testing instrument and temperature control assembly thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 3 -- United States Patent no. 12,782,200, issued on Nov. 3, was assigned to WISTRON Corp. (New Taipei City, Taiwan).

"Testing instrument and temperature control assembly thereof" was invented by Chen-An Sung (New Taipei City, Taiwan), Chiung-Wei Chen (New Taipei City, Taiwan) and Cheng-Hsing Liu (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature control assembly includes a plurality of heating units and a plurality of temperature sensors. The heating units are arranged in a ring shape, and the temperature sensors are respectively arranged on the heating units. Each of the heating units includes a bearing hole and a heating body. The heating body surrou...