US Patent Issued to Wistron on March 3 for "Method for establishing defect detection model and electronic apparatus" (Taiwanese Inventors)

ALEXANDRIA, Va., March 3 -- United States Patent no. 12,566,995, issued on March 3, was assigned to Wistron Corp. (New Taipei City, Taiwan).

"Method for establishing defect detection model and electronic apparatus" was invented by Jia-Hong Zhang (New Taipei City, Taiwan) and Shih-Yi Chao (New Taipei City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for establishing a defect detection model and an electronic apparatus are provided. A first classification model is established based on a training sample set including a plurality of training samples. The training samples are respectively input to the first classification model to obtain a classification result of each training sample. A plural...