US Patent Issued to Winbound Electronics on June 30 for "Method and apparatus for memory testing" (Taiwanese Inventors)

ALEXANDRIA, Va., July 16 -- United States Patent no. 12,670,968, issued on June 30, was assigned to Winbound Electronics Corp. (Taichung City, Taiwan).

"Method and apparatus for memory testing" was invented by Chien-Min Wu (Taichung City, Taiwan), Shao-Ching Liao (Taichung City, Taiwan) and Kuang-Chih Hsieh (Taichung City, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and an apparatus for memory testing are provided. The method includes following steps: after multiple dies are idle for a first time, performing a first stage test on the dies, and setting multiple flags corresponding to the dies that fail the first stage test to a first logic level; after the dies are idle for a second time, p...