ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,738,340, issued on Sept. 15, was assigned to Winbond Electronics Corp. (Taichung City, Taiwan).
"Flash memory and testing method thereof" was invented by I-Hsien Tseng (Taichung City, Taiwan), Lung-Chi Cheng (Taichung City, Taiwan) and Hsiu-Han Liao (Taichung City, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A flash memory and a testing method thereof are provided. The testing method includes following steps: performing an erase verification reference value adjustment step, including adjusting a erase verification current from a normal erase verification current to a fast bit screening erase verification current, and adjusting a soft program ...