US Patent Issued to WAYLAND ADDITIVE on Sept. 15 for "Method of monitoring and influencing an additive layer manufacturing process" (British Inventors)

ALEXANDRIA, Va., Sept. 15 -- United States Patent no. 12,734,755, issued on Sept. 15, was assigned to WAYLAND ADDITIVE Ltd. (Huddersfield, Great Britain).

"Method of monitoring and influencing an additive layer manufacturing process" was invented by Andrew Thomas Lees (Tadcaster, Great Britain) and Harry Kenneth Shuttleworth (Huddersfield, Great Britain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method of monitoring and influencing an additive layer manufacturing process, in which selective fusing of powder material in successively applied layers is carried out to manufacture a three-dimensional article, comprises delivery to a work space, for example in a vacuum chamber (12) of electron beam additive ...